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Laboratory Explorations to Accompany Microelectronic Circuits

Seventh Edition

Vincent C. Gaudet and Kenneth C. Smith

Publication Date - November 2014

ISBN: 9780199339259

120 pages
Paperback
8 x 10 inches

In Stock

Retail Price to Students: $32.95

Concise, clear experiments--designed with varying levels of difficulty and to be completed in a single lab period--that are tied directly to Sedra/Smith's "learn by doing" approach.

Description

Designed to accompany Microelectronic Circuits, Seventh Edition, by Adel S. Sedra and Kenneth C. Smith, Laboratory Explorations invites students to explore the realm of real-world engineering through practical, hands-on experiments.

Taking a "learn-by-doing" approach, it presents labs that focus on the development of practical engineering skills and design practices. Experiments start from concepts and hand analysis, and include simulation, measurement, and post-measurement discussion components. A complete solutions manual is also available to adopting instructors.

Contact your Oxford University Press sales representative for information on how to package Laboratory Explorations with Microelectronic Circuits, Seventh Edition, for great savings!

Features

  • Includes clear and concise experiments of varying levels of difficulty
  • Challenging "Extra Exploration" sections follow each experiment
  • Each experiment is conveniently designed to fit into a single lab period and can be completed using minimal equipment
  • Also compatible with National Instrument's myDAQ, giving students the opportunity to complete assignments outside of the traditional lab environment

About the Author(s)

Vincent C. Gaudet is Professor and Associate Chair for Undergraduate Studies in the Department of Electrical and Computer Engineering at the University of Waterloo.

Kenneth C. Smith is Professor Emeritus in Electrical and Computer Engineering, Computer Science, Industrial and Mechanical Engineering, and Information Studies at the University of Toronto.

Previous Publication Date(s)

July 2013
January 1998

Table of Contents

    List of Experiments
    All references are to Microelectronic Circuits, Seventh Edition, by Sedra & Smith

    CHAPTER 2 Operational Amplifiers
    Lab 2.1 Inverting Op-Amp Configuration
    Lab 2.2 Non-Inverting Op-Amp Configuration
    Lab 2.3 Difference Amplifier
    Lab 2.4 Instrumentation Amplifier
    Lab 2.5 Lossy Integrator
    Lab 2.6 Lossy Differentiator

    CHAPTER 4 Diodes
    Lab 4.1 Diode I-V Transfer Curve
    Lab 4.2 Fun with Diodes I: Rectifiers
    Lab 4.3 Fun with Diodes II: Limiting and Clamping Circuits

    CHAPTER 5 MOS Field-Effect Transistors (MOSFETs)
    Lab 5.1 NMOS I-V Characteristics
    Lab 5.2 PMOS I-V Characteristics
    Lab 5.3 NMOS at DC
    Lab 5.4 PMOS at DC

    CHAPTER 6 Bipolar Junction Transistors (BJTs)
    Lab 6.1 NPN I-V Characteristics
    Lab 6.2 PNP I-V Characteristics
    Lab 6.3 NPN at DC
    Lab 6.4 PNP at DC

    CHAPTER 7 Transistor Amplifiers
    Lab 7.1 NMOS Common-Source Amplifier
    Lab 7.2 PMOS Common-Source Amplifier
    Lab 7.3 NMOS Common-Source Amplifier with Source Degeneration
    Lab 7.4 PMOS Common-Source Amplifier with Source Degeneration
    Lab 7.5 NMOS Common-Gate Amplifier
    Lab 7.6 PMOS Common-Gate Amplifier
    Lab 7.7 NMOS Source Follower
    Lab 7.8 PMOS Source Follower
    Lab 7.9 NPN Common-Emitter Amplifier
    Lab 7.10 PNP Common-Emitter Amplifier
    Lab 7.11 NPN Common-Emitter Amplifier with Emitter Degeneration
    Lab 7.12 PNP Common-Emitter Amplifier with Emitter Degeneration
    Lab 7.13 NPN Common-Base Amplifier
    Lab 7.14 PNP Common-Base Amplifier
    Lab 7.15 NPN Emitter Follower
    Lab 7.16 PNP Emitter Follower
    Lab 7.17 NMOS vs. NPN: Common-Source/Common-Emitter Amplifier Comparison

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