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Cover

Principles of Materials Characterization and Metrology

Kannan M. Krishnan

May 2021

ISBN: 9780198830269

880 pages
Paperback
246x189mm

In Stock

Price: £35.00

This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

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Description

This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.

  • Goes well beyond characterization, as the techniques are also used to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach
  • Key points and features of the techniques presented throughout the book are summarised in easy-to-read tables
  • Summaries highlight important information covered, worked examples help consolidate information, test-your-knowledge questions helps understanding of information presented in the text, and problems motivate students to hone their skills.
  • Helps readers learn the principles of characterization by building on their knowledge of elementary chemistry, physics, and materials science.

About the Author(s)

Kannan M. Krishnan, Professor, Dept of Materials Science & Engineering, Adjunct Professor, Dept of Physics, University of Washington

Kannan M. Krishnan graduated from the Indian Institute of Technology, Kanpur and earned his Ph.D. from University of California, Berkeley (UCB) in 1984. He is currently Professor of Materials Sciences and Physics at the University of Washington (UW). He is a Fellow of the American Physical Society, the Institute of Physics (London), the American Association for the Advancement of Science, and the Institute of Electrical and Electronics Engineers (IEEE). He has received the Burton Medal (MSA), the Fink Prize (IEEE), the Guggenheim and Rockefeller fellowships, a Fulbright Specialist award, the Distinguished Engineer/Scientist award (TMS) and the Alexander von Humboldt Research Award, and has been elected a member of the Washington State Academy of Sciences. With visiting appointments at institutions in all six continents and multiple teaching awards at UCB, UW and professional societies (IEEE Magnetics Distinguished Lectureship), he is widely recognized for his role in education.

Table of Contents

    1:Introduction to materials characterization, analysis, and metrology
    2:Atomic structure and spectra
    3:Bonding and spectra of molecules and solids
    4:Crystallography and diffraction
    5:Probes: sources and their interactions with matter
    6:Optics, optical methods, and microscopy
    7:X-ray diffraction
    8:Diffraction of electrons and neutrons
    9:Transmission and analytical electron microscopy
    10:Scanning electron microscopy
    11:Scanning probe microscopy
    12:Summary tables

Reviews

"Very timely and of paramount importance to both students and senior researchers." - Peter Fischer, Lawrence Berkeley National Lab

"Comprehensive, well organized, and should appeal as a fundamental text to a wide range of first and second year undergraduates studying Materials Science, Engineering, Physics, Chemistry or Geology." - David Cardwell, University of Cambridge

"Materials characterization is at the core of what Materials Scientists and Engineers do, and this book strikes a fine balance between fundamentals and applications for the different techniques." - Juan Claudio Nino, University of Florida

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