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Published: 30 May 2021

496 Pages | 275

9.2 x 6.1 inches

ISBN: 9780198856559

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Bookseller Code (06)

Introduction to Scanning Tunneling Microscopy Third Edition

Third Edition

C. Julian Chen

Monographs on the Physics and Chemistry of Materials

  • Only book about Scanning Tunneling Microscopy STM and Atomic Force Microscopy AFM that provides an integrated treatment of both theory and experiment (instrumentation)
  • Provides a good introduction for newcomers
  • Includes valuable material and hints for the experts

New to this Edition:

  • Theory and practice of the observation and mapping of atomic and molecular wave functions.
  • Elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling.
  • Scanning tunnelling spectroscopy of high Tc superconductors.
  • Imaging of self-assembled organic molecules on the solid-liquid interfaces.
  • Elementary mathematical derivation of some key formulas.

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