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Defect and Microstructure Analysis by Diffraction

Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge

A International Union of Crystallography Publication

International Union of Crystallography Monographs on Crystallography

This book reviews the state of the art for determining the real structure of crystals, taking into account the irregularities and defects that work their way into all crystal arrangements. Understanding these defects is crucial for continued progress in developing new materials.

$395.00

Hardcover

Published: 16 March 2000

808 Pages | 365 halftones & line illus.

ISBN: 9780198501893

Bookseller Code (06)

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Defect and Microstructure Analysis by Diffraction

Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge

A International Union of Crystallography Publication

International Union of Crystallography Monographs on Crystallography

Description

Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods are undoing this effect, using the discrepancies themselves to describe microstructure of the material with unprecedented accuracy. These techniques in turn play a key role in many of the evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. It lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this research is to extract all of the information locked in the powder diffraction pattern including the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a specimen.

Defect and Microstructure Analysis by Diffraction

Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge

A International Union of Crystallography Publication

International Union of Crystallography Monographs on Crystallography

List of contributors
Abbreviations
1. Introduction to defect and microstructure analysis or the analysis of real structure, Jaroslav Fiala and Robert L. Snyder
Part I. Fundamentals of defect analysis by diffraction
2. Some applications of the kinematical theory of X-ray diffraction, Hans Bradaczek
3. Profile fitting and analytical functions, Stefano Enzo and Liliana Schiffini
4. Effects of instrument function, crystallite size, and strain on reflection profiles, V. Honkimäki and P. Suortti
5. Use of pattern decomposition or simulation to study microstructure: theoretical considerations, J. Ian Langford
6. Classical treatment of line profiles influenced by strain, small size, and stacking faults, C. R. Houska and R. Kuzel
7. Voigt function model in diffraction-line broadening analysis, Davor Balzar
8. X-ray analysis of precipitation-related crystals with dislocation substructure, R. I. Barabash
9. Analytic functions describing line profiles influenced by size distribution, strain, and stacking faults, C. R. Houska and R. Kuzel
10. The dislocation-based model of strain broadening in X-ray line profile analysis, T. Ungár
11. Diffraction-line broadening analysis of dislocation configurations, A. C. Vermeulen et al.
12. Diffraction-line broadening analysis of strain fields in crystalline solids, J. G. M. van Berkum et al.
13. Paracrystallinity, Hans Bradaczek
14. The model of the paracrystal and its application to polymers, W. Wilke
15. Effect of planar defects in crystals on the position of powder diffraction lines, A. I. Ustinov
16. Effect of stacking disorder on the profile of the powder diffraction line, Z. Weiss and P. Capková
Part II. Experimental techniques
17. Crystallite statistics and accuracy in powder diffraction intensity measurements, Deane K. Smith
18. Reciprocal space mapping and ultra-high resolution diffraction of polycrystalline materials, Paul F. Fewster and Norman L. Andrew
Part III. Macrostress
19. X-Ray analysis of the inhomogenous stress state, I. Kraus and N. Ganev
Part IV. Texture
20. Texture and structure of polycrystals, Hans J. Bunge
21. Texture effects in powder diffraction and their correction by simple empirical functions, V. Valvoda
Part V. Whole-pattern fitting
22. Accounting for size and microstrain in whole-powder pattern fitting, A. Le Bail
23. Modelling of texture in whole-pattern fitting, Matti Järvinen
24. A new whole-powder pattern-fitting approach, P. Scardi
25. The role of whole-pattern databases in materials science, Deane K. Smith
Part VI. Restoring physical patterns from the observed variables
26. Restoration and preprocessing of physical profiles from measured data, Marian Cernansky
27. Towards higher resolution: a mathematical approach, Derk Reefman
Part VII. Applications
28. Use of pattern decomposition to study microstructure: practical aspects and applications, Daniel Louër
29. X-ray diffraction broadening effects in materials characterization, Giora Kimmel and David Dayan
30. Crystal size and distortion parameters in fibres using Wide-Angle X-ray Scattering (WAXS), R. Somashekar
31. Pressure-induced profile change of energy-dispersive diffraction using synchrotron radiation, Takamitsu Yamanaka
Index