"Explains the theory and methods behind the techniques of x-ray scattering structure analysis of crystals. Downplaying, but not eliminating, the mathematics involved, chapters discuss: crystal growth, evaluation, and mounting; symmetry and space group determination, data collection using four-circle diffractometers, area detectors, Fourier syntheses, structure determination by Patterson methods, direct methods of crystal structure determination, maximum entropy, least-squares fitting of parameters, structure refinement, the derivation and interpretation of results, the crystallographic information file, and crystallographic databases. Originating in an intensive course in x-ray structure analysis organized on behalf of the Chemical Crystallography Group of the British Crystallographic Association, this text assumes basic knowledge of crystal structure determination."--SciTech Book News