Journals Higher Education
Important We hope you are enjoying our new website. More information about the changes



This item is printed to order. Items which are printed to order are normally despatched and charged within 5-10 days.

Published: 19 September 1996

520 Pages | 4 colour plates, numerous halftones, line figures and maps


ISBN: 9780198513872

Bookseller Code (AQ)

Atom Probe Field Ion Microscopy

M. K. Miller, A. Cerezo, M. G. Hetherington, and G. D. W. Smith FRS

Clarendon Press

Monographs on the Physics and Chemistry of Materials

  • Full coverage of the new 3-D atom probe technology developed by the authors
  • This technique is emerging as one of the most important experimental method of atomic-scale science
  • Rigorous treatment of statistical analysis techniques needed for interpretation of atom probe data
  • Proper coverage of basic physics and ion optics for atom probe systems
  • Comprehensive literature reviews on metallurgical, semiconductor and surface studies