An Introduction to Mixed-Signal IC Test and Measurement
Gordon Roberts, Friedrich Taenzler, and Mark Burns
With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming.
An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations--featuring state-of-the-art industrial technology--to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.
New to this Edition:
- A new chapter on RF Test Methods and Fundamentals of RF Testing
- A new chapter on Clock and Serial Data Communications Channel Measurements
- Coverage of RF load board design
- New coverage of probabilistic reasoning for mixed-signal testing